atomic force microscopy magnetic force microscopy Microscopy which uses a sharp magnetic spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of a magnetic specimen. An image of the surface is obtained by mechanically moving the tip in a raster scan of the specimen, line by line, and recording the magnetic force experienced by it as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. MFM magnetic-force microscopy CHMO:0000115