dynamic secondary ion mass spectrometry sputtered neutral atom mass spectrometry secondary neutral particle mass spectrometry dynamic neutral particle mass spectrometry SNMS dynamic neutral atom mass spectrometry secondary neutral atom mass spectroscopy dynamic neutral atom mass spectroscopy secondary neutral particle mass spectroscopy dynamic neutral particle mass spectroscopy CHMO:0000562 sputtered neutral atom mass spectroscopy Mass spectrometry where the sample is bombarded with a continuous focused beam of primary mass-selected ions which remove material from the surface of the sample by sputtering. The neutral atoms ejected from the sample are ionised and detected. secondary neutral atom mass spectrometry sputtered neutral particle mass spectroscopy