atomic force microscopy conductive atomic force microscopy CHMO:0000874 Conductive AFM is used for collecting simultaneous topography imaging and current imaging. Specifically, standard conductive AFM operates in contact AFM mode. Variations in surface conductivity can be distinguished using this mode. Conductive AFM operates in contact AFM mode by using a conductive AFM tip. The contact tip is scanned in contact with the sample surface. Just like contact AFM, the feedback loop uses the DC cantilever deflection signal to maintain a constant force between the tip and the sample to generate the topography image. At the same time, a DC bias is applied to the tip. The sample is held at ground potential. CAFM conductive AFM C-AFM