high-resolution transmission electron microscopy aberration-corrected high-resolution transmission electron microscopy CHMO:0001091 aberration-corrected HRTEM Microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50–150 kV under vacuum and the phase contrast between transmitted electron waves is used to produce an image. The beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). aberration corrected high resolution transmission electron microscopy