atomic force microscopy non-contact mode atomic force microscopy non-contact mode AFM DSFMAR CHMO:0001898 noncontact scanning force microscopy DFM-AR Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The tip oscillates in the 'attractive' force region, i.e. avoiding sample contact. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. dynamic mode AFM NC-AFM noncontact atomic force microscopy DSFMA DSFM-AR 2009-06-02T11:02:43Z dynamic AFM https://orcid.org/0000-0001-5985-7429 noncontact mode scanning force microscopy attractive dynamic scanning force microscopy dynamic force microscopy in attractive regime DFMAR NC-SFM dynamic-mode AFM dynamic scanning force microscopy in attractive regime noncontact mode AFM