high-angular annular dark-field scanning transmission electron microscopy abberration-corrected high-angular annular dark-field scanning transmission electron microscopy abberration-corrected high-angle annular dark-field scanning transmission electron microscopy https://orcid.org/0000-0001-5985-7429 abberration corrected high angular annular dark field scanning transmission electron microscopy Microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). AC-HAADF-STEM 2009-07-31T01:46:06Z CHMO:0002235 aberration-corrected transmission electron microscopy