non-contact mode atomic force microscopy Kelvin probe force microscopy CHMO:0002457 Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The conducting tip forms a capacitor with the surface, over which it is scanned laterally at a constant separation, in order to map the change in work function of the surface. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. Kelvin force microscopy SSPM https://orcid.org/0000-0001-5985-7429 2009-09-23T06:01:55Z KPFM scanning surface potential microscopy KFM Kelvin probe microscopy