transmission electron microscopy aberration-corrected transmission electron microscopy https://orcid.org/0000-0001-5985-7429 aberration-corrected TEM Microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50–150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). CHMO:0002613 2009-11-23T04:28:09Z spherical-aberration-corrected transmission electron microscopy Cs-corrected TEM spherical-aberration-corrected TEM