scanning transmission electron micrograph high-angular annular dark-field scanning transmission electron micrograph An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. high angle annular dark field scanning transmission electron micrograph https://orcid.org/0000-0001-5985-7429 CHMO:0002619 HAADF-STEM images high angular annular dark-field scanning transmission electron micrograph high-angle annular dark-field scanning transmission electron micrograph 2009-11-24T04:00:55Z HAADF-STEM image