scattering near-field optical microscopy infrared scattering near-field optical microscopy IR scattering SNOM 2010-01-09T11:03:42Z IR sSNOM CHMO:0002663 SNIM IR imaging IR scattering-type near-field optical microscopy IR SNIM https://orcid.org/0000-0001-5985-7429 Microscopy where a probe consisting of an infrared laser transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen and focused to a diffraction-limited spot size. A vibrating metallic AFM cantilever tip periodically and locally modifies the electromagnetic field distribution of the excitation laser. An image is produced by scanning the probe over the specimen and detecting the scattered light from the tip as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. IR scattering near-field optical microscopy infrared sSNOM infrared scattering SNOM infrared s-SNOM infrared scattering-type near-field optical microscopy IR s-SNOM