atomic force infrared microscopy surface atomic force infrared microscopy https://orcid.org/0000-0001-5985-7429 CHMO:0002667 The simultaneous collection of AFM topography data and spatially-resolved infrared spectra by measuring the infrared absorption via transient deformation of the AFM cantilever induced by an infrared pulsed laser (tuned to a wavelength that corresponds to a vibrational absorbing wavelength in the specimen) as a function of AFM tip position. Mid-IR radiation, generated using a periodically poled LiNbO3 crystal emitting tuneable laser is focussed directly on the specimen surface. s-AFMIR surface atomic force microscopy infrared microscopy surface AFMIR 2010-01-09T11:37:10Z